{"ModuleCode":"PC5209","ModuleTitle":"Accelerator Based Materials Characterisation","Department":"Physics","ModuleDescription":"The course gives an introduction to the physics of ion beam analysis. After a general introduction, inter-atomic potentials, cross sections and stopping powers are discussed, and the theory of the stopping process is developed based on the Thomas-Fermi statistical atom. Accelerators and other instrumentation are introduced, and a range of analytical techniques is discussed in detail: Rutherford Backscattering (RBS), Proton Induced X-ray Emission (PIXE), Elastic Recoil Detection Analysis (ERDA), Nuclear Reaction Analysis NRA, and Accelerator Mass Spectrometry (AMS). Finally, the more specialised fields of Nuclear Microscopy and Synchrotron radiation are discussed.","ModuleCredit":"4","Workload":"3-1-0-1-5","Prerequisite":"Students who have passed either one of these modules. PC4244, PC4212, PC4261, or Departmental Approval","ExamDuration":"P2H","ExamVenue":"S12-04-02","Types":["Module"],"AcadYear":"2014/2015","History":[{"Semester":1,"ExamDate":"2014-12-01T13:00+0800","Timetable":[{"ClassNo":"SL1","LessonType":"Lecture","WeekText":"Every Week","DayText":"Tuesday","StartTime":"1000","EndTime":"1200","Venue":"S12-0403"},{"ClassNo":"SL1","LessonType":"Lecture","WeekText":"Every Week","DayText":"Friday","StartTime":"1000","EndTime":"1200","Venue":"S12-0403"}],"IVLE":[{"Announcements":null,"Forums":[],"Workbins":[],"Webcasts":[],"Gradebooks":[],"Polls":[],"Multimedia":[],"LessonPlan":[],"ID":"9b8feffc-4b74-4e8b-9d63-ea1941591141","CourseLevel":"1","CourseCode":"PC5209","CourseName":"ACCELERATOR BASED MATERIALS CHARACTERISATION","CourseDepartment":"","CourseSemester":"Semester 1","CourseAcadYear":"2014/2015","CourseOpenDate":"/Date(1403020800000+0800)/","CourseOpenDate_js":"2014-06-18T00:00:00","CourseCloseDate":"/Date(1417881540000+0800)/","CourseCloseDate_js":"2014-12-06T23:59:00","CourseMC":"0","isActive":"N","Permission":"S","Creator":{"UserID":null,"Name":"Chan Taw Kuei","Email":null,"Title":null,"UserGuid":"e26ff739-2df2-4715-a457-b2bcaf0a153d","AccountType":null},"hasGradebookItems":false,"hasTimetableItems":true,"hasGroupsItems":false,"hasClassGroupsForSignUp":false,"hasGuestRosterItems":true,"hasClassRosterItems":false,"hasWeblinkItems":false,"hasLecturerItems":true,"hasDescriptionItems":true,"hasReadingItems":false,"hasAnnouncementItems":false,"hasProjectGroupItems":false,"hasProjectGroupsForSignUp":false,"hasConsultationItems":false,"hasConsultationSlotsForSignUp":false,"hasLessonPlanItems":false,"Badge":0,"BadgeAnnouncement":0,"WebLinks":[],"Lecturers":[{"ID":"d935df1b-0752-48fa-baf4-d3b19f6dfcb8","User":{"UserID":null,"Name":"Chan Taw Kuei","Email":null,"Title":null,"UserGuid":"e26ff739-2df2-4715-a457-b2bcaf0a153d","AccountType":null},"Role":"Lecturer ","Order":1,"ConsultHrs":null}],"Descriptions":[{"ID":"1e5f053b-8835-4692-be49-41f07234cfff","Title":"Learning Outcomes","Description":"The objective of the course is to introduce the methods of Ion Beam Analysis (IBA), which is materials characterization using ion beams. The main advantage of IBA is in its capability to perceive depth up to the order of microns beneath the sample surface in a non-destructive manner, yielding the information of target stoichiometry as a function of depth. In order to generate ion beams, accelerators are required, hence the name of the module. This course aims to give students insight into the practical non-desctructive materials characterization which are applicable in the research fields of advanced materials and nanoelectronics.
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\r\nThe course begins with a significant emphasis on the theoretical fundamentals of ion-solid interactions. Such fundamentals directly determine the method and accuracy of the useful information extracted from IBA methods. After the fundamentals, the course will go into a detailed discussion of the method of Rutherford Backscattering Spectrometry (RBS), which is a staple of IBA in performing non-destructive depth profiling. Following that, the course will touch on the equipment hardware (e.g. accelerators and charged particle detectors) as well as the necessary electronic signal processing during the collection of spectrometric data. Finally, the course will introduce the various other methods of IBA: Proton Induced X-ray Emission (PIXE), Elastic Recoil Detection Analysis (ERDA), Nuclear Reaction Analysis (NRA), and Accelerator Mass Spectrometry (AMS). A brief introduction of elemental imaging as well as 3D tomography using microbeam methods will be given at the end.
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\r\nComplementing the lectures are tutorials and student presentations. In particular, the student presentations will serve to illustrate the wide applicability of IBA methods to other disciplines, such as Art, Geology, Archaeology and Environmental research.","Order":1},{"ID":"2e5f053b-8835-4692-be49-41f07234cfff","Title":"Prerequisites","Description":"Students who have passed either one of these modules. PC4244, PC4212, PC4261, or Departmental Approval ","Order":2},{"ID":"3e5f053b-8835-4692-be49-41f07234cfff","Title":"Teaching Modes","Description":"
\r\n\tThe course will be conducted in a traditional lecture-tutorial format. There are 20 lectures and at least 4 tutorials, all conducted during the class times. There may be occasions where certain lectures or tutorials will be conducted in e-learning format, where screencasts of the lectures will be placed online for online or offline viewing by students.
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\r\n\tAll lecture materials (lecture notes and tutorials) will be placed on IVLE, along with announcements and discussions in an online forum. Whenever possible, extra materials or links to multimedia will also be posted.
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